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				HITACHI S-3000N
				SCANNING ELECTRON MICROSCOPE (SEM)
				The S-3000N is a PC controlled variable pressure SEM with the ability to switch between the high vacuum and variable pressure modes. It has a high density frame memory of 1280x960 pixels and an advanced image capture and archiving system. Four quadrant solid state backscatter allows imaging in the compositional, 3D and topographic modes by manipulating from each segment of the detector.   System Specifications 0.3 - 30kV acceleration voltage range 3.0nm resolution at 25kV 4.5nm resolution at 25kV in variable pressure mode 150mm diameter maximum specimen size Dual-bias for low voltage signal noise Energy dispersive analysis with elemental mapping X-ray fluorescence analysis Backscatter mode
				ANALYSIS OF FORENSIC MATERIAL USING THE S-3000N
				The gray image is acquired from the SEM. The color images are elemental maps made using the energy dispersive system (EDS) and indicate the elemental distribution. Below is an EDS spectrum and the weight percentages of the elements contained in the mineral vivianite that is deposited on bone

Document last revised Thursday, November 10, 2005 2:43 PM

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Electron Microscopy Center, P.O. Box 42451, Lafayette LA 70504
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