 |
|
|
|
|
|
|
| HOME | FACILITIES | FACULTY & STAFF | IMAGE
GALLERY |
| |
| DIGITAL INSTRUMENTS |
| ATOMIC FORCE MICROSCOPE |
| |
| |
 |
The Dimension 3000 Scanning Probe Microscope (SPM) utilizes
automated atomic force microscopy (AFM) and scanning tunneling microscopy
(STM) techniques to measure surface characteristics for semiconductor wafers,
lithography masks, magnetic media, CDs/DVD's, biomaterials, optics and
other samples up to 200mm in diameter. Integrated top view video optics with
motorized zoom help identify areas of interest for detailed scanning quickly.
Changing scanning techniques from AFM to STM requires no tools. |
| |
| HIGH MAGNIFICATION IN
WATER |
| Atomic force microscopy of wood immersed in water. The left
image shows topographic properties and the right image shows mechanical
properties. |
| |
 |
 |
| images submitted by Dr. Thomas Pesacreta |
| |
| |
| |
| |
| |
| |
Document last revised
Thursday, November 10, 2005 2:38 PM
© Copyright 2003 by the University of Louisiana at Lafayette
Electron Microscopy Center, P.O. Box 42451, Lafayette LA 70504
Billeaud Hall, Room 137 · 337/482-5769 · thomas@louisiana.edu
