Dual Beam Scanning Electron and Focused Ion Beam Microscope

Thermo Scientific Scios 2 Dual Beam scanning electron microscope and focused ion beam with Thermo Scientific UltraDry Energy Dispersive Spectrometry (EDS) detector and Pathfinder software for elemental analysis. This instrument allows for acquisition of extremely high magnification 3-D, electron images of almost any type of sample. It can also mill into samples with a separate gallium ion beam so that sub-surface layers can be studied. The attached EDS system enables elemental distribution of surface and sub-surface regions to be chemically identified and mapped.

(Zeolitic imidazolate framework-67) nanoparticles grown on fibers. Zizhou He