You are here

Home » Facilities & Equipment

Thermionic Scanning Electron Microscope

Hitachi S3000N Thermionic Scanning Electron Microscope is a variable pressure SEM capable of imaging specimens at high vacuum and in a variable pressure range from 1-270 Pa.  This allows non-conducting specimens to be imaged without coating with a conductive film.  The microscope has an IXRF EDS system for elemental analysis. The system is used for magnifications of 10000x or less.

Scanning electron image of thistle pits

Thistle pits

Scanning electron image of aluminum failure

Aluminum failure

 

Scanning electron image of osteoblasts

Osteoblast